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Nanocharacterization in Dentistry.

• Authors : Sharma, Shivani^1,2 ; Cross, Sarah E.^1,2 ; Hsueh, Carlin¹

Subjects: *DENTISTRY; *BIOFILMS; *DENTAL implantsUNITED States

• Source: International Journal of Molecular Sciences. Jun2010, Vol. 11 Issue 6, p2523-2545. 23p. 2 Color Photographs, 1 Diagram, 1 Chart, 1 Graph.

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Nanotechnology: Could it be a small world after all?

• Authors : Blow, Nathan

Subjects: *SCIENTISTS; *SCANNING probe microscopy; *MOLECULAR biologyUNITED States

• Source: Nature. 4/17/2008, Vol. 452 Issue 7189, p901-904. 4p. 7 Color Photographs.

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Operation of near-field scanning millimeter-wave microscopy up to 67 GHz under scanning electron microscopy vision

• Authors : Polovodov, P; Theron, Didier; Eliet, S. ...

Subjects: RF nanotechnology; near-Field scanning microwave microscopy (NSMM); atomic force microscopy (AFM)Los Angeles (On-line event); United States

• Source: Proceedings of IEEE/MTT-S International Microwave Symposium, IMS 2020 ; IEEE MTT International Microwave Symposium, IMS 2020 ; https://hal.science/hal-03022574 ; IEEE MTT International Microwave

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AFM fabrication of sub-10-nanometer metal-oxide devices with in situ control of electrical...

• Authors : Snow, E.S.; Campbell, P.M.

• Source: Science. 12/8/1995, Vol. 270 Issue 5242, p1639. 3p. 3 Color Photographs, 3 Graphs.

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Defect motion on an InP(110) surface observed with noncontact atomic force microscopy.

• Authors : Sugawara, Yasuhiro; Ohta, Masahiro

• Source: Science. 12/8/1995, Vol. 270 Issue 5242, p1646. 3p. 3 Black and White Photographs, 3 Diagrams.

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Strain rate sensitivity of germanium-selenium glasses

• Authors : Trenvouez, Gwenole; Bernard, Cédric; Nivard, Mariette ...

Subjects: Indentation; Strain rate; Chalcogenide glassesBoston; United StatesBoston, United States

• Source: 25th International Congress on Glass (ICG 2019)https://hal.science/hal-0215707825th International Congress on Glass (ICG 2019), Jun 2019, Boston, United

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Digital Forensic Atomic Force Microscopy of Semiconductor Memory Arrays

• Authors : Gray, Struan; Axelsson, Stefan;

Subjects: Atomic force microscopy; memory chip delidding; surface imagingOrlando; FL; United States

• Source: IFIP Advances in Information and Communication Technology ; 15th IFIP International Conference on Digital Forensics (DigitalForensics) ; https://hal.inria.fr/hal-02534609 ; 15th IFIP International

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News Spectrum.

• Source: Spectroscopy. Nov2010, Vol. 25 Issue 11, p14-17. 3p.

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Atomic Force Microscopy-related techniques applied to the nanocharacterization of mechanical and chemical properties of plant cell walls and bioinspired polymer films

• Authors : Molinari, Michaël; Muraille, Loic; Bercu, Bogdan ...

Subjects: atomic force microscopy-related technique; nanochracterization; mechanical properties of plant cellBoston; United StatesBoston, United States

• Source: 2014 MRS Fall Meeting and Exhibithttps://hal.science/hal-011870342014 MRS Fall Meeting and Exhibit, Nov 2014, Boston, United States

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"Feeling Molecules with the Atomic Force Microscope".

• Authors : Hansma, Helen G.¹

• Source: Science. 11/20/92 Supplement, Vol. 258, p18-18. 1/2p.

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